Publication of the journal

The section is currently being updated

The use of attenuators with add-on absorbing elements based on distributed resistive strictures with various mounting arrangements in microstrip route provides not only lower costs at the design, development and operation stages of RF and microwave devices, but also increased broadband, lower sensitivity to point defects and inhomogeneities, variation of technological parameters, greater reliability and resistance to temperature effects compared to absorbing elements based on discrete film resistors manufactured according to P- or T-circuits. Thermal condition is an important parameter of attenuator’s safe and efficient operation. Elevated temperature and its non-uniform distribution over the surface of absorbing element’s resistive film cause degradation of accuracy characteristics, service life decrease and full failure of attenuator. In this work, using the Autodesk Simulation CFD software package, an analysis of the steady-state thermal condition of microstrip attenuators with 2 × 2 mm and 1 × 1 mm add-on film absorbing elements based on distributed resistive structures is carried out. The effect of the absorbing element mounting arrangement (with a resistive film down, up, into a hole in the microstrip line), of the resistive film topology and the amount of attenuation, of the substrate material type and thickness, and of the metallization of its reverse side on the maximum temperature and its distribution in the resistive film of the attenuator absorbing element has been investigated. The results obtained make it possible to assay the degree of the studied design parameters effect on the thermal condition of the attenuator, which significantly affects reliability, accuracy characteristics and the level of dissipated power. The simulation results are presented in the form of graphs, analyzed, and can be used to optimize the designs of microstrip attenuators, as well as other devices with add-on elements for the considered mounting arrangements.
Anton V. Pilkevich
Nizhny Novgorod State Technical University n. a. R. E. Alekseev (Russia, 603950, Nizhny Novgorod, Minin st., 24)
Viktor D. Sadkov
Nizhny Novgorod State Technical University n. a. R. E. Alekseev (Russia, 603950, Nizhny Novgorod, Minin st., 24)

124498, Moscow, Zelenograd, Bld. 1, Shokin Square, MIET, editorial office of the Journal "Proceedings of Universities. Electronics", room 7231

+7 (499) 734-62-05
magazine@miee.ru